Scanning electron microscope Supra 40 with the annex INCAx-act for energy dispersive microanalysis

SEM analisys types:

• Image acquisition of nanoscale objects (conductive and non-conductive) by methods of TEM, such as:
  • nanoparticles (nanopowders),
  • nanorods,
  • nanofibers,
  • nanotubes,
  • nanowires,
  • nanodisks
  with the spatial resolution down to 0.2 nm.
• Image analysis obtaining quantitative data about the size and shape of nano-objects, the degree of agglomerable and size destribution.
• Preparation by the SEM method pictures of cross section structures and sample surfaces of nanostructured thin object (conductive or nonconductive), including thin films, coatings, nanochips electrolyte and electrode structures with a spatial resolution down to 2 nm.
• Obtaining of the numerical data on the size of layers, the size and shape of the nanocrystals (granules), pores, intercrystallite boundaries, inter-layer interfaces and other features of the structure.