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Class of scanning probe microscopes and profilometers:

Types of analysis by scanning probe microscopy:

  • Image acquisition in the contact, semi-contact and non-contact modes of atomic force microscopy.
  • Image acquisition in phase contrast mode.
  • Image acquisition mode tunneling microscope.

микроскоп микроскоп

Microscope class with AFM / SCI CMM-2000


микроскоп микроскоп

Class with profilometers model 130